X-Ray Spectrometry

Aims & Scope

X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.

Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.

Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs.

Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	1.5
2024	1.50

SJR (SCImago Journal Rank)

Year	Value
2024	0.411

Quartile

Year	Value
2024	Q3

h-index

Year	Value
2024	53

Journal Rank

Year	Value
2024	13546

Journal Citation Indicator

Year	Value
2024	203

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Chemistry, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Assignment of pre‐edge peaks in K‐edge x‐ray absorption spectra of 3d transition metal compounds: electric dipole or quadrupole?

  Citation: 679

  Authors: Takashi

• Analysis of X‐ray spectra by iterative least squares (AXIL): New developments

  Citation: 411

  Authors: B., K., L., F., P.

• A simple method to evaluate the matrix effects in X‐Ray fluorescence analysis

  Citation: 340

  Authors: M., L., M.

• L shell fluorescence yields and coster—kronig transition probabilities for the elements with 25 ⩽ <i>Z</i> ⩽ 96

  Citation: 228

  Authors: S., D., B., Nirmal, P. N.

• X-ray fluorescence spectrometry in art and archaeology

  Citation: 205

  Authors: Michael, Manfred

• A Gaussian expression to describe Ï•(ρ <i>z</i> ) curves for quantitative electron probe microanalysis

  Citation: 202

  Authors: R. H., J. D.

• Total reflection x‐ray fluorescence analysis—a review

  Citation: 193

  Authors: P.

• Multivariate analysis of statistically poor EDXRD spectra for the detection of concealed explosives

  Citation: 188

  Authors: R. D., M. J., J. A., R. J.

• Kβ/Kα ratios in energy‐dispersive x‐ray emission analysis

  Citation: 179

  Authors: Md. R., M.

• Use of microscopic XRF for non-destructive analysis in art and archaeometry

  Citation: 176

  Authors: K., G., I., A., B., L., F., I., O., F., A., A., A., A.

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