Ultramicroscopy
Published by Elsevier
ISSN : 0304-3991 eISSN : 1879-2723
Abbreviation : Ultramicroscopy
Aims & Scope
Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications.
The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
View Aims & ScopeMetrics & Ranking
Impact Factor
| Year | Value |
|---|---|
| 2025 | 2 |
| 2024 | 2.10 |
SJR (SCImago Journal Rank)
| Year | Value |
|---|---|
| 2024 | 0.716 |
Quartile
| Year | Value |
|---|---|
| 2024 | Q2 |
h-index
| Year | Value |
|---|---|
| 2024 | 142 |
Journal Rank
| Year | Value |
|---|---|
| 2024 | 7893 |
Journal Citation Indicator
| Year | Value |
|---|---|
| 2024 | 849 |
Impact Factor Trend
Abstracting & Indexing
Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.
Subjects & Keywords
Journal’s research areas, covering key disciplines and specialized sub-topics in Materials Science and Physics and Astronomy, designed to support cutting-edge academic discovery.
Most Cited Articles
The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.
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Quantitative measurement of displacement and strain fields from HREM micrographs
Citation: 2376
Authors: M.J., E., R.
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EMS - a software package for electron diffraction analysis and HREM image simulation in materials science
Citation: 1883
Authors: P.A.
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In situ site-specific specimen preparation for atom probe tomography
Citation: 1576
Authors: K., D., D.J., J.D., T.F., B.
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An improved ptychographical phase retrieval algorithm for diffractive imaging
Citation: 1285
Authors: Andrew M., John M.
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High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy
Citation: 978
Authors: Shaoxia, Greg, Abdul R., Garib N., Judith M., Sjors H.W., Richard
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3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography
Citation: 935
Authors: P.A., M.
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The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography
Citation: 789
Authors: Wim, Willem Jan, Jan, Thomas, Sara, K. Joost, Jan
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Grain detection from 2d and 3d EBSD data—Specification of the MTEX algorithm
Citation: 643
Authors: Florian, Ralf, Helmut