Surface Science Spectra

Aims & Scope

Surface Science Spectra (SSS) offers convenient and easy access to peer-reviewed spectral data from on-going international industrial and academic research.

SSS publishes reference, comparison, and technical spectra representing a range of spectra, including XPS, AES, and SIMS.

SSS features over 780 different materials with downloadable data, as well as focused topics that contribute to the completeness of the archival database by including collections of spectra on materials of particular interest to the community.

SSS systematically and uniformly archives surface data from a wide range of fields, giving you usable reference spectra and the latest findings from new research and materials important to your work.

SSS makes available each spectrum in its unsmoothed and unmanipulated form so that you know you are looking at original data, not someone else's interpretation.

By submitting your research to this important project, you are joining a list of scientists and researchers who have contributed the important analytical reference information that surface scientists and lab analysts need.

SSS is available online as well as in a yearly printed volume.

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	1.6

SJR (SCImago Journal Rank)

Year	Value
2024	0.456

Quartile

Year	Value
2024	Q2

h-index

Year	Value
2024	37

Journal Rank

Year	Value
2024	12503

Journal Citation Indicator

Year	Value
2024	183

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Materials Science and Physics and Astronomy, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Characterization of NiO by XPS

  Citation: 484

  Authors: A. N.

• TiO2 by XPS

  Citation: 309

  Authors: Ulrike, T. E.

• Characterization of <i>β</i>-Ni(OH)2 by XPS

  Citation: 185

  Authors: A. N.

• 2-D Material Molybdenum Disulfide Analyzed by XPS

  Citation: 181

  Authors: D., S., Richard T.

• SnO2 by XPS

  Citation: 178

  Authors: Michael A., Anthony

• Silicon (100)/SiO2 by XPS

  Citation: 167

  Authors: David S., Supriya S., Nitesh, Michael A., Andrew E., Mark H., Matthew R.

• Elemental Palladium by XPS

  Citation: 157

  Authors: Maria C., Steven J.

• Characterization of Electrochemically Prepared <i>γ</i>-NiOOH by XPS

  Citation: 156

  Authors: A. N., C. A.

• Mn2O3 by XPS

  Citation: 144

  Authors: Michael A.

• CuO by XPS

  Citation: 138

  Authors: R. P.

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