Surface and Interface Analysis

Aims & Scope

Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films.

Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems.

Papers dealing with the purely theoretical aspects of the technique will also be considered.

Review articles will be published; prior consultation with one of the Editors is advised in these cases.

Papers must clearly be of scientific value in the field and will be submitted to two independent referees.

Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal.

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	1.8
2024	1.60

SJR (SCImago Journal Rank)

Year	Value
2024	0.397

Quartile

Year	Value
2024	Q3

h-index

Year	Value
2024	103

Journal Rank

Year	Value
2024	13874

Journal Citation Indicator

Year	Value
2024	607

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Chemistry, Materials Science and Physics and Astronomy, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

  Citation: 4887

  Authors: M. P., W. A.

• Investigation of multiplet splitting of Fe 2p XPS spectra and bonding in iron compounds

  Citation: 3225

  Authors: A. P., B. A., M. C., N. S.

• Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range

  Citation: 2234

  Authors: S., C. J., D. R.

• Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

  Citation: 1961

  Authors: C. D., L. E., M. V., J. A., R. H., L. H.

• Advanced analysis of copper X‐ray photoelectron spectra

  Citation: 1625

  Authors: Mark C.

• X‐ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems

  Citation: 1553

  Authors: Mark C., Brad P., Leo W. M., Andrea, Roger St. C.

• Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range

  Citation: 1113

  Authors: S., C. J., D. R.

• Ce 3d XPS investigation of cerium oxides and mixed cerium oxide (Ce _<i>x</i> Ti _<i>y</i> O _<i>z</i> )

  Citation: 1093

  Authors: Eric, Patrice, Danielle, Stéphane, Gilles

• Resolving ruthenium: XPS studies of common ruthenium materials

  Citation: 1001

  Authors: David J.

• Surface Oxidation and Reduction of CuO and Cu2O Studied Using XPS and XAES

  Citation: 987

  Authors: S., P. M., P., M.

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