Optoelectronics, Instrumentation and Data Processing
Published by Pleiades Publishing
ISSN : 8756-6990 eISSN : 1934-7944
Abbreviation : Optoelectron. Instrum. Data Process.
Aims & Scope
The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images; artificial intelligence methods; automated measurement systems; physicotechnical foundations of micro- and optoelectronics; optical information technologies; systems and components; modelling in physicotechnical research; laser physics applications; computer networks and data transmission systems.
The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.
View Aims & ScopeMetrics & Ranking
Impact Factor
| Year | Value |
|---|---|
| 2025 | 0.5 |
| 2024 | 0.50 |
SJR (SCImago Journal Rank)
| Year | Value |
|---|---|
| 2024 | 0.209 |
Quartile
| Year | Value |
|---|---|
| 2024 | Q3 |
h-index
| Year | Value |
|---|---|
| 2024 | 16 |
Journal Rank
| Year | Value |
|---|---|
| 2024 | 20656 |
Journal Citation Indicator
| Year | Value |
|---|---|
| 2024 | 127 |
Impact Factor Trend
Abstracting & Indexing
Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.
Subjects & Keywords
Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering and Physics and Astronomy, designed to support cutting-edge academic discovery.
Most Cited Articles
The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.
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Silicon diffractive optical elements for high-power monochromatic terahertz radiation
Citation: 45
Authors: A. N., B. O., A. K., B. A., G. I., V. S., V. A., K. N., E. V., Yu. Yu.
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Development of methods and instruments for optical ellipsometry at the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences
Citation: 35
Authors: E. V., S. V., V. A.
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State-of-the-art Architectures and Technologies of High-Efficiency Solar Cells Based on III–V Heterostructures for Space and Terrestrial Applications
Citation: 32
Authors: N. A., V. M., M. Z., O. P.
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Wavefront compensation method using a Shack-Hartmann sensor as an adaptive optical element system
Citation: 29
Authors: A. V., V. V., Yu. V., A. G.
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Interference photolithography with the use of resists on the basis of chalcogenide glassy semiconductors
Citation: 27
Authors: V. A., I. Z., V. I., P. E.
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Regression estimate of the multidimensional probability density and its properties
Citation: 25
Authors: A. V., V. A.
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Laser Technologies in Micro-Optics. Part 2. Fabrication of Elements with a Three-Dimensional Profile
Citation: 24
Authors: A. G., V. P., V. P., R. A., M. M.
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Measuring information signal parameters under additive non-Gaussian correlated noise
Citation: 24
Authors: V. M., V. I.