Nanomanufacturing and Metrology

Aims & Scope

We are pleased to announce that Nanomanufacturing and Metrology will become a fully open access (OA) in 2023.

See journal updates for more information.

Nanomanufacturing and Metrology is a peer-reviewed, international and interdisciplinary research journal and is the first journal over the world that provides a principal forum for nano-manufacturing and nano-metrology.

Nanomanufacturing and Metrology publishes in the forms including original articles, cutting-edge communications, timely review papers, technical reports, and case studies.

Special issues devoted to developments in important topics in nano-manufacturing and metrology will be published periodically.

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	4.5

SJR (SCImago Journal Rank)

Year	Value
2024	0.672

Quartile

Year	Value
2024	Q2

h-index

Year	Value
2024	23

Journal Rank

Year	Value
2024	8517

Journal Citation Indicator

Year	Value
2024	370

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering and Materials Science, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Promising Lithography Techniques for Next-Generation Logic Devices

  Citation: 138

  Authors: Rashed Md. Murad, Xichun

• Recent Advances in Micro/Nano-cutting: Effect of Tool Edge and Material Properties

  Citation: 97

  Authors: Fengzhou, Feifei

• Advances in Atomic Layer Deposition

  Citation: 97

  Authors: Jingming, Yicheng, Kun, Rong

• Distance Measurements Using Mode-Locked Lasers: A Review

  Citation: 85

  Authors: Yoon-Soo, Seung-Woo

• Femtosecond Laser Micro/Nano-manufacturing: Theories, Measurements, Methods, and Applications

  Citation: 84

  Authors: Baoshan, Jingya, Yanhong, Ningwei, Jingang, Kunpeng

• Laser Interference Lithography for Fabrication of Planar Scale Gratings for Optical Metrology

  Citation: 74

  Authors: Yuki

• Study on Diamond Cutting of Ion Implanted Tungsten Carbide With and Without Ultrasonic Vibration

  Citation: 50

  Authors: Jinshi, Fengzhou, Guangpeng, Yuebin

• AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes

  Citation: 50

  Authors: Roberto, Gian Bartolo, Luigi

• Reduction in Cross-Talk Errors in a Six-Degree-of-Freedom Surface Encoder

  Citation: 47

  Authors: Hiraku, Ryo, Masaya, Xinghui, Yuki, Wei

• Advances in Rotary Ultrasonic-Assisted Machining

  Citation: 46

  Authors: Lorcan, Chengwei, Fengzhou

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