Microscopy and Microanalysis

Aims & Scope

Microscopy and Microanalysis is an international microscopy journal published for the Microscopy Society of America by Oxford University Press.

Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis.

This distinguished international forum is intended for microscopists in both biology and materials science.

The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure.

Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	3
2024	2.90

SJR (SCImago Journal Rank)

Year	Value
2024	0.465

Quartile

Year	Value
2024	Q2

h-index

Year	Value
2024	82

Journal Rank

Year	Value
2024	12298

Journal Citation Indicator

Year	Value
2024	1221

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science
• Medline

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Physics and Astronomy, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• A Review of Strain Analysis Using Electron Backscatter Diffraction

  Citation: 1142

  Authors: Stuart I., Matthew M., David P.

• Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

  Citation: 778

  Authors: Colin

• Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram

  Citation: 732

  Authors: Olof C., Justin A., Järg, Dieter, David N.

• SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position

  Citation: 499

  Authors: David N.

• High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy

  Citation: 417

  Authors: Mark W., Prafull, Darol, Kayla X., Robert, Celesta S., Pratiti, Emrah, John T., Darrell G., Daniel C., Gregory D., Katherine S., Hugh T., David A., Sol M.

• Review of Atom Probe FIB-Based Specimen Preparation Methods

  Citation: 369

  Authors: Michael K., Kaye F., Keith, Roger, David J.

• New Techniques for the Analysis of Fine-Scaled Clustering Phenomena within Atom Probe Tomography (APT) Data

  Citation: 308

  Authors: Leigh T., Michael P., Peter V., Simon P.

• An Improved Cryogen for Plunge Freezing

  Citation: 301

  Authors: William F., Ariane, Grant J.

• EBSD Image Quality Mapping

  Citation: 298

  Authors: Stuart I., Matthew M.

• Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Ã… Information Limit

  Citation: 263

  Authors: C., B., M., H., S., G., P., M., S., M., M., S., H., P., B., D., I., E.A., T., E.A., A.R., J., S.J., I.M., A.M., A.K., T., V., Q.M., M., R., E.A., P., U.

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