Metrology

Aims & Scope

The name Metrology hints that the journal’s focus is on the formal definition of metrology: “metrology is the science of measurement and its application” [1], where it is noted that metrology includes all theoretical and practical aspects of measurement, regardless of what the measurement uncertainty and field of application may be.

This broad scope does not imply that any modeled or physical measurement can be published in Metrology: rather, the journal is concerned with innovative concepts, new perspectives, and illustrations of applications from which other readers can benefit, operating beyond the traditional boundaries between metrology fields.

Basic metrological concepts such as uncertainty evaluation and traceability to the seven base units of the International System of Units are the natural background and requirement for all contributions.

Metrology covers a broad range of areas, such as studies related to the following topics: • Traceability to SI units of complex measurement systems; • Measurement theory in a broad context; • Measurement uncertainty and uncertainty evaluation; • Considerations on the fundamentals of measurement; • Error separation methods; • Novel methods inspired by the redefinition of the SI; • Cyberphysical systems; • Artificial intelligence, especially its effect on traceability; • Machine learning for metrology; • Precision measurement; • Digital twins; • Metrology for sustainable manufacturing; • Precision manufacturing; • Measurement techniques and devices; • Interferometry; • XCT measurements; • 3D metrology; • Frequency metrology; • Surface metrology; • Biomedical measurement; • Virtual measurement; • Power measurement.

Metrics & Ranking

Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Directory of Open Access Journals (DOAJ)

Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering and Physics and Astronomy, designed to support cutting-edge academic discovery.

Licensing & Copyright

This journal operates under an Open Access model. Articles are freely accessible to the public immediately upon publication. The content is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0), allowing users to share and adapt the work with proper attribution.

Copyright remains with the author(s), and no permission is required for non-commercial use, provided the original source is cited.

Policy Links

This section provides access to essential policy documents, guidelines, and resources related to the journal’s publication and submission processes.

• Aims scope
• Homepage
• Oa statement
• Author instructions
• License terms
• Review url
• Board url
• Copyright url
• Plagiarism url
• Preservation url
• Apc url
• License

Plagiarism Policy

This journal follows a plagiarism policy. All submitted manuscripts are screened using reliable plagiarism detection software to ensure originality and academic integrity. Authors are responsible for proper citation and acknowledgment of all sources, and any form of plagiarism, including self-plagiarism, will not be tolerated.

For more details, please refer to our official: Plagiarism Policy.

APC Details

The journal’s Article Processing Charge (APC) policies support open access publishing in Engineering and Physics and Astronomy, ensuring accessibility and quality in research dissemination.

This journal requires an Article Processing Charge (APC) to support open access publishing, covering peer review, editing, and distribution. The current APC is 1,000.00 CHF. Learn more.

Explore journals without APCs for alternative publishing options.