Journal of Integrated Circuits and Systems

Aims & Scope

The Journal of Integrated Circuits and Systems is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering intended to present state-of-art papers on Integrated Circuits and Systems, covering the fields of Process and Materials, Device and Characterization, Design, Test and CAD, among other relevant topics.

View Aims & Scope

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Metrics & Ranking

Journal Rank

Year	Value
2024	23394

Journal Citation Indicator

Year	Value
2024	119

SJR (SCImago Journal Rank)

Year	Value
2024	0.166

Quartile

Year	Value
2024	Q4

h-index

Year	Value
2024	14

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering, designed to support cutting-edge academic discovery.

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Licensing & Copyright

This journal operates under an Open Access model. Articles are freely accessible to the public immediately upon publication. The content is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0), allowing users to share and adapt the work with proper attribution.

Copyright remains with the author(s), and no permission is required for non-commercial use, provided the original source is cited.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Impact of the Series Resistance in the I-V Characteristics of Junctionless Nanowire Transistors and its dependence on the Temperature

  Citation: 42

  Authors: Rodrigo T., Renan D., Michelly, Marcelo Antonio

• Tradeoff of FPGA Design of a Floating-point Library for Arithmetic Operators

  Citation: 39

  Authors: Daniel M., Diego F., Carlos H., Mauricio

• Study Of MOS Capacitors With TiO2 And SiO2/TiO2 Gate Dielectric

  Citation: 32

  Authors: Katia F., M. A., I.

• A Review of SOI Technology and its Applications

  Citation: 22

  Authors: Bich-Yen, George, Carlos

• Hardware Implementation for the HEVC Fractional Motion Estimation Targeting Real-Time and Low-Energy

  Citation: 22

  Authors: Vladimir, Henrique, Luan, Bruno, Marcelo, Luciano, Altamiro

• A Review on Photonic Crystal Logic Gates

  Citation: 18

  Authors: Luis Eduardo, Omar Paranaiba

• Effect of substrate type on structure of TiO2 thin film deposited by atomic layer deposition technique

  Citation: 18

  Authors: R. S., F. P., G. E., W., H. S., L. V.

• MOSFET ZTC Condition Analysis for a Self-biased Current Reference Design

  Citation: 16

  Authors: Pedro, Hamilton, David, Sergio, Eric

• Ab initio Molecular Dynamics Simulations of Field-Coupled Nanocomputing Molecules

  Citation: 15

  Authors: Yuri, Alessandro, Giuliana, Gianluca, Mariagrazia

• Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors

  Citation: 13

  Authors: Frank Sill, Rodrigo Possamai

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