Journal of Electronic Testing: Theory and Applications (JETTA)

Aims & Scope

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing.

This is the only journal devoted specifically to electronic testing.

The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance.

The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners.

While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard.

Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufacturing yield and design for yield improvement; Failure mode analysis and process improvement

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	1.3
2024	1.10

Journal Rank

Year	Value
2024	16142

Journal Citation Indicator

Year	Value
2024	213

SJR (SCImago Journal Rank)

Year	Value
2024	0.316

Quartile

Year	Value
2024	Q3

h-index

Year	Value
2024	38

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip

  Citation: 225

  Authors: Vikram, Krishnendu, Erik Jan

• Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

  Citation: 206

  Authors: Ujjwal, Daniel, Mohammad

• On-Line Testing for VLSI—A Compendium of Approaches

  Citation: 169

  Authors: M., Y.

• I DDQ testing: A review

  Citation: 129

  Authors: Jerry M., Charles F., Ravi K., Weiwei

• An FPGA-Based Approach for Speeding-Up Fault Injection Campaigns on Safety-Critical Circuits

  Citation: 79

  Authors: P., L., M., M. Sonza, M.

• An analytical approach to the partial scan problem

  Citation: 79

  Authors: Arno, Hans-Joachim

• The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

  Citation: 74

  Authors: Erik Jan

• Double Node Upsets Hardened Latch Circuits

  Citation: 71

  Authors: Yuanqing, Haibin, Suying, Xi, Zhiyuan, Jiangtao

• Security Against Hardware Trojan Attacks Using Key-Based Design Obfuscation

  Citation: 70

  Authors: Rajat Subhra, Swarup

• A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment

  Citation: 69

  Authors: Ujjwal, Daniel, Mohammad

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