Aims & Scope

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software.

The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies.

The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions.

Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

View Aims & Scope

Metrics & Ranking

Impact Factor

Year Value
2025 1.9

SJR (SCImago Journal Rank)

Year Value
2024 0.357

Quartile

Year Value
2024 Q3

h-index

Year Value
2024 87

Journal Rank

Year Value
2024 14963

Journal Citation Indicator

Year Value
2024 403

Impact Factor Trend


Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.


Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Computer Science and Engineering, designed to support cutting-edge academic discovery.


Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.


Quick Facts

Current Factor
1.9
First Published: 2025

SJR (SCImago Journal Rank)

SJR
0.357
First Published: 2024

Quartile

Current Quartile
Q3
First Published: 2024

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