Experience of Designing and Application of CAD Systems in Microelectronics
Published by IEEE
ISSN : 2572-7591
Abbreviation : Exp. Des. Appl. CAD Syst. Microelectron.
Metrics & Ranking
SJR (SCImago Journal Rank)
| Year | Value |
|---|---|
| 2024 | 0.151 |
Quartile
| Year | Value |
|---|---|
| 2024 | Q4 |
h-index
| Year | Value |
|---|---|
| 2024 | 13 |
Journal Rank
| Year | Value |
|---|---|
| 2024 | 24479 |
Journal Citation Indicator
| Year | Value |
|---|---|
| 2024 | 32 |
Abstracting & Indexing
Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.
Subjects & Keywords
Journal’s research areas, covering key disciplines and specialized sub-topics in Computer Science, Engineering and Mathematics, designed to support cutting-edge academic discovery.