Electronics Letters
Published by John Wiley & Sons
ISSN : 0013-5194 eISSN : 1350-911X
Abbreviation : Electron. Lett.
Aims & Scope
Electronics Letters is an internationally renowned peer-reviewed rapid-communication journal that publishes short original research papers every two weeks.
Its broad and interdisciplinary scope covers the latest developments in all electronic engineering related fields.
Each issue also provides further insight into recent research with special features and interviews with its authors, editorial Board and guest writers.
View Aims & ScopeMetrics & Ranking
SJR (SCImago Journal Rank)
Year | Value |
---|---|
2024 | 0.269 |
Quartile
Year | Value |
---|---|
2024 | Q3 |
h-index
Year | Value |
---|---|
2024 | 160 |
Impact Factor
Year | Value |
---|---|
2024 | 0.70 |
Journal Rank
Year | Value |
---|---|
2024 | 17791 |
Journal Citation Indicator
Year | Value |
---|---|
2024 | 5816 |
Impact Factor Trend
Abstracting & Indexing
Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.
Subjects & Keywords
Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering, designed to support cutting-edge academic discovery.
Licensing & Copyright
This journal operates under an Open Access model. Articles are freely accessible to the public immediately upon publication. The content is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0), allowing users to share and adapt the work with proper attribution.
Copyright remains with the author(s), and no permission is required for non-commercial use, provided the original source is cited.
Policy Links
This section provides access to essential policy documents, guidelines, and resources related to the journal’s publication and submission processes.
- Aims scope
- Homepage
- Oa statement
- Author instructions
- License terms
- Review url
- Board url
- Copyright url
- Plagiarism url
- Preservation url
- Apc url
- License
Plagiarism Policy
This journal follows a plagiarism policy. All submitted manuscripts are screened using reliable plagiarism detection software to ensure originality and academic integrity. Authors are responsible for proper citation and acknowledgment of all sources, and any form of plagiarism, including self-plagiarism, will not be tolerated.
For more details, please refer to our official: Plagiarism Policy.
APC Details
The journal’s Article Processing Charge (APC) policies support open access publishing in Engineering, ensuring accessibility and quality in research dissemination.
This journal does not charge a mandatory Article Processing Charge (APC). However, optional open access publication may incur fees based on the publisher’s policies.
Explore journals without APCs for alternative publishing options.
Most Cited Articles
The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.
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Near Shannon limit performance of low density paritycheck codes
Citation: 1679
Authors: D.J.C., R.M.
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Reducing the peak-to-average power ratio of multicarriermodulation by selected mapping
Citation: 1301
Authors: R.W., R.F.H., J.B.
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Detection algorithm and initial laboratory resultsusing V-BLAST space-time communication architecture
Citation: 1229
Authors: G.D., C.J., R.A., P.W.
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OFDM with reduced peak-to-average power ratio byoptimum combination of partial transmit sequences
Citation: 999
Authors: S.H., J.B.
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Exact representation of antenna system diversity performance from input parameter description
Citation: 981
Authors: S., J., I.
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Universal relations for coupling of optical powerbetweenmicroresonators and dielectric waveguides
Citation: 932
Authors: A.