Electronic Device Failure Analysis

Aims & Scope

Electronic Device Failure Analysis is a growing technical resource for the Failure Analysis engineer.

Each quarterly issue covers: - Contributed technical articles that cover everything from operations to techniques - Insight into trends in the microelectronics FA industry, to keep you up-to-date - New product announcements - Recognition of outstanding contributions to the field of FA - Looking to update some skills?

The Training Calendar provides an easy way to know what courses are coming up in the months ahead. - News of the Electronic Device Failure Analysis Society. - Guest Columns provide that vital perspective into other FA.

View Aims & Scope

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Metrics & Ranking

SJR (SCImago Journal Rank)

Year	Value
2024	0.131

Quartile

Year	Value
2024	Q4

h-index

Year	Value
2024	7

Journal Rank

Year	Value
2024	26268

Journal Citation Indicator

Year	Value
2024	17

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Atomic Precision Advanced Manufacturing for Digital Electronics

  Citation: 9

  Authors: Daniel R., Scott W., Evan M., Ezra, Lisa, Tzu-Ming, Leon N., Andrew, Deanna M., Michael T., Shashank

• Experiences with Layout-Aware Diagnosis—A Case Study

  Citation: 7

  Authors: Yi-Jung, Man-Ting, Mike, Albert, Martin, Geir, Brady, Ting-Pu

• Electron Beam Testing and Characterization – Past, Present, and Future

  Citation: 7

  Authors: David C.

• Health Monitoring of Lithium-Ion Batteries

  Citation: 4

  Authors: Bhanu, Christopher, Michael, Michael

• ABCs of Photon Emission Microscopy

  Citation: 3

  Authors: Michael R., Victoria J.

• Magnetic Current Imaging in Failure Analysis

  Citation: 3

  Authors: Antonio

• An Innovative Multi-Probe Tomographic Atomic Force Microscope for Materials Research and Failure Analysis

  Citation: 3

  Authors: D., M., Patrick, A.D.L., L., T., U.

• Laser Voltage Probe (LVP): A Novel Optical Probing Technology for Flip-Chip Packaged Microprocessors

  Citation: 2

  Authors: Wai Mun, Mario, Travis, Valluri

• Combinational Logic Analysis with Laser Voltage Probing

  Citation: 2

  Authors: Venkat Krishnan, Winson, Gopinath, Angeline

• 3-D Through-Silicon Via Technology

  Citation: 2

  Authors: E.

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