ECS Solid State Letters

Aims & Scope

Cessation.

SSL was launched in 2012 and was published until the end of 2015.

It was dedicated to the rapid dissemination of peer-reviewed and concise research reports in fundamental and applied areas of solid-state science and technology.

SSL is preserved as an archive.

Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar

Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Engineering and Materials Science, designed to support cutting-edge academic discovery.

Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Amorphous-InGaZnO4 Thin-Film Transistors with Damage-Free Back Channel Wet-Etch Process

  Citation: 85

  Authors: S. H., Y. C., M., D. H., J.

• Fabrication and Characterization of Li7La3Zr2O12 Thin Films for Lithium Ion Battery

  Citation: 84

  Authors: J., A.

• Multi-Layer MoS2 FET with Small Hysteresis by Using Atomic Layer Deposition Al2O3 as Gate Insulator

  Citation: 53

  Authors: A.-J., S., K., S. D., H., J.-Y.

• Carbonized Wood for Supercapacitor Electrodes

  Citation: 52

  Authors: S., G., W., A.

• Optimization of TiO2/Cu/TiO2 Multilayer as Transparent Composite Electrode (TCE) Deposited on Flexible Substrate at Room Temperature

  Citation: 50

  Authors: A., T. L.

• Negative Bias and Illumination Stress Induced Electron Trapping at Back-Channel Interface of InGaZnO Thin-Film Transistor

  Citation: 50

  Authors: M. P., D., J., M.

• Side Wall Wetting Induced Void Formation due to Small Solder Volume in Microbumps of Ni/SnAg/Ni upon Reflow

  Citation: 50

  Authors: Y. C., C., K. N.

• Efficient Red Emission of Blue-Light Excitable New Structure Type NaMgPO4:Eu2+ Phosphor

  Citation: 49

  Authors: S. W., T., T., K., K., M.

• Effect of Nitrogen Doping on Variability of TaOx -RRAM for Low-Power 3-Bit MLC Applications

  Citation: 48

  Authors: S. H., N., J., S., J., J., S., J., H.

• Effect of Ge Concentration in GexSe1-x Chalcogenide Glass on the Electronic Structures and the Characteristics of Ovonic Threshold Switching (OTS) Devices

  Citation: 48

  Authors: S.-D., H.-W., S. y., D. S., S. H., H., B.-k., D. W., S.