Applied Surface Science

Aims & Scope

Applied Surface Science covers topics contributing to a better understanding of surfaces, interfaces, nanostructures and their applications.

The journal is concerned with scientific research on the atomic and molecular level of material properties determined with specific surface analytical techniques and/or computational methods, as well as the processing of such structures.

View Aims & Scope

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Metrics & Ranking

Impact Factor

Year	Value
2025	6.9

Quartile

Year	Value
2024	Q1

SJR (SCImago Journal Rank)

Year	Value
2024	1.310

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Abstracting & Indexing

Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.

• Scopus
• Google Scholar
• Web of Science

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Subjects & Keywords

Journal’s research areas, covering key disciplines and specialized sub-topics in Chemistry, Materials Science and Physics and Astronomy, designed to support cutting-edge academic discovery.

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Most Cited Articles

The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.

• Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Cr, Mn, Fe, Co and Ni

  Citation: 7985

  Authors: Mark C., Brad P., Andrew P., Leo W.M., Andrea R., Roger St.C.

• Analysis of XPS spectra of Fe2+ and Fe3+ ions in oxide materials

  Citation: 5823

  Authors: Toru, Peter

• Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn

  Citation: 3840

  Authors: Mark C., Leo W.M., Andrea R., Roger St.C.

• A review on g-C 3 N 4 -based photocatalysts

  Citation: 2742

  Authors: Jiuqing, Jun, Xiaobo, Xin

• X-ray photoelectron spectroscopy of select multi-layered transition metal carbides (MXenes)

  Citation: 1772

  Authors: Joseph, Kevin M., Michael, Per, Yury, Johanna, Michel W.

• X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

  Citation: 1266

  Authors: M, X, Y.H, Z.L, X.D, C, R.F, L.S

• Reliable determination of chemical state in x-ray photoelectron spectroscopy based on sample-work-function referencing to adventitious carbon: Resolving the myth of apparent constant binding energy of the C 1s peak

  Citation: 1236

  Authors: G., L.

• Surface modification and enhanced photocatalytic CO2 reduction performance of TiO2: a review

  Citation: 1088

  Authors: Jingxiang, Bei, Jiaguo

• XPS determination of Mn oxidation states in Mn (hydr)oxides

  Citation: 944

  Authors: Eugene S., Jeffrey E., Peter J., Florence T., Sebastien N.

• Electron beam lithography: resolution limits and applications

  Citation: 917

  Authors: C., F., A., Y., M., A., L., L., H.

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