Applied Microscopy
Published by Springer Nature
ISSN : 2287-5123 eISSN : 2287-4445
Abbreviation : Appl. Microsc.
Aims & Scope
Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy.
The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determination of structure and chemistry.
All articles published by Applied Microscopy follows Continuous Article Publishing (CAP), so there will be no delay in publication upon acceptance.
View Aims & ScopeMetrics & Ranking
Journal Rank
Year | Value |
---|---|
2024 | 13326 |
Journal Citation Indicator
Year | Value |
---|---|
2024 | 86 |
SJR (SCImago Journal Rank)
Year | Value |
---|---|
2024 | 0.421 |
Quartile
Year | Value |
---|---|
2024 | Q3 |
Abstracting & Indexing
Journal is indexed in leading academic databases, ensuring global visibility and accessibility of our peer-reviewed research.
Subjects & Keywords
Journal’s research areas, covering key disciplines and specialized sub-topics in Immunology and Microbiology, designed to support cutting-edge academic discovery.
Licensing & Copyright
This journal operates under an Open Access model. Articles are freely accessible to the public immediately upon publication. The content is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0), allowing users to share and adapt the work with proper attribution.
Copyright remains with the author(s), and no permission is required for non-commercial use, provided the original source is cited.
Policy Links
This section provides access to essential policy documents, guidelines, and resources related to the journal’s publication and submission processes.
- Aims scope
- Homepage
- Oa statement
- Author instructions
- License terms
- Review url
- Board url
- Copyright url
- Plagiarism url
- Preservation url
- Apc url
- License
Plagiarism Policy
This journal follows a plagiarism policy. All submitted manuscripts are screened using reliable plagiarism detection software to ensure originality and academic integrity. Authors are responsible for proper citation and acknowledgment of all sources, and any form of plagiarism, including self-plagiarism, will not be tolerated.
For more details, please refer to our official: Plagiarism Policy.
Most Cited Articles
The Most Cited Articles section features the journal's most impactful research, based on citation counts. These articles have been referenced frequently by other researchers, indicating their significant contribution to their respective fields.
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Structural Analysis of Exosomes Using Different Types of Electron Microscopy
Citation: 36
Authors: Hyosun, Ji Young
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Hole Defects on Two-Dimensional Materials Formed by Electron Beam Irradiation: Toward Nanopore Devices
Citation: 36
Authors: Hyo Ju, Gyeong Hee, Zonghoon
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Raman Spectroscopic Studies on Two-Dimensional Materials
Citation: 34
Authors: Jae-Ung, Minjung, Hyeonsik
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Synthesis and Properties of Two Dimensional Doped Transition Metal Dichalcogenides
Citation: 29
Authors: Aram, Zonghoon
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Microstructural Characterization of SS304 upon Various Shot Peening Treatments
Citation: 23
Authors: Yinsheng, Kejian, In Shik, Chang Soon, In Gyu, Jung-il, Cheol-Woong, Je-Hyun, Keesam
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How to Get Well-Preserved Samples for Transmission Electron Microscopy
Citation: 17
Authors: Chang-Hyun, Hyun-Wook, Im Joo, Chang-Sub
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A Correlative Approach for Identifying Complex Phases by Electron Backscatter Diffraction and Transmission Electron Microscopy
Citation: 16
Authors: Seon-Hyeong, Jae-Bok, Majid, Chan-Gyung
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Tunable Nanostructure of TiO<sub>2</sub>/Reduced Graphene Oxide Composite for High Photocatalysis
Citation: 16
Authors: Di, Yongli, Jinshu, Yilong, Qier